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Off-Axis Electron Holographic Focal Series of GaN

Niermann, Tore; Lehmann, Michael (Contributor)

This is a high resolution off-axis electron hologram series obtained with a transmission electron microscope of a Gallium Nitride (GaN) crystal in <11-20> zoneaxis orientation at atomic resolution. It contains the raw data of two holographic focal series obtained under equal conditions (no strong changes in illumination or microscope setup) a few minutes apart. The first series is a focal series of object holograms, where the GaN-crystal was located in one of the partial waves. The second series is taken with object removed from the field of view. The MTF of the camera is also supplied.