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Main Title: Development of a hard X-ray split-and-delay line and performance simulations for two-color pump-probe experiments at the European XFEL
Author(s): Lu, Wei
Friedrich, B.
Noll, Tino
Zhou, K.
Hallmann, J.
Ansaldi, G.
Roth, T.
Serkez, Svitozar
Geloni, G.
Madsen, Anders
Eisebitt, Stefan
Type: Article
Language Code: en
Abstract: A hard X-ray Split-and-Delay Line (SDL) under construction for the Materials Imaging and Dynamics station at the European X-Ray Free-Electron Laser (XFEL) is presented. This device aims at providing pairs of X-ray pulses with a variable time delay ranging from −10 ps to 800 ps in a photon energy range from 5 to 10 keV for photon correlation and X-ray pump-probe experiments. A custom designed mechanical motion system including active feedback control ensures that the high demands for stability and accuracy can be met and the design goals achieved. Using special radiation configurations of the European XFEL’s SASE-2 undulator (SASE: Self-Amplified Spontaneous Emission), two-color hard x-ray pump-probe schemes with varying photon energy separations have been proposed. Simulations indicate that more than 109 photons on the sample per pulse-pair and up to about 10% photon energy separation can be achieved in the hard X-ray region using the SDL.
Issue Date: 28-Jun-2018
Date Available: 18-May-2020
DDC Class: 530 Physik
Subject(s): Split-and-Delay Line
European X-Ray Free-Electron Laser
free electron lasers
hard X-ray
Sponsor/Funder: BMBF, 05K13KT4, Verbundprojekt FSP 302 - Freie-Elektronen-Laser: Nanoskopische Systeme. Teilprojekt 1: Split-and-Delay Instrument für die European XFEL Beamline Materials Imaging and Dynamics
BMBF, 05K16BC1, Split-and-Delay Instrument für die European XFEL Beamline Materials Imaging and Dynamics
Journal Title: Review of Scientific Instruments
Publisher: American Institute of Physics (AIP)
Publisher Place: Melville, NY
Volume: 89
Issue: 6
Article Number: 063121
Publisher DOI: 10.1063/1.5027071
EISSN: 1089-7623
ISSN: 0034-6748
Notes: This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Review of Scientific Instruments 89, 063121 (2018) and may be found at
Appears in Collections:FG Röntgenoptik und Nanometer-Optik » Publications

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