Please use this identifier to cite or link to this item: http://dx.doi.org/10.14279/depositonce-10033
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Main Title: Design and throughput simulations of a hard x-ray split and delay line for the MID station at the European XFEL
Author(s): Lu, Wei
Noll, T.
Roth, T.
Agapov, I.
Geloni, G.
Holler, M.
Hallmann, J.
Ansaldi, G.
Eisebitt, Stefan
Madsen, Anders
Type: Article
Language Code: en
Abstract: A hard X-ray Split and Delay Line (SDL) under development for the Materials Imaging and Dynamics (MID) station at the European X-Ray Free-Electron Laser (XFEL.EU) is presented. This device will provide pairs of X-ray pulses with a variable time delay ranging from −10 ps to 800 ps in a photon energy range from 5 to 10 keV. Throughput simulations in the SASE case indicate a total transmission of 1.1% or 3.5% depending on the operation mode. In the self-seeded case of XFEL.EU operation simulations indicate that the transmission can be improved to more than 11%.
URI: https://depositonce.tu-berlin.de/handle/11303/11142
http://dx.doi.org/10.14279/depositonce-10033
Issue Date: 27-Jul-2016
Date Available: 18-May-2020
DDC Class: 530 Physik
Subject(s): delay lines
hard x-rays
free electron lasers
Split-and-Delay Line
SDL
European X-Ray Free-Electron Laser
XFEL
Sponsor/Funder: BMBF, 05K13KT4, Verbundprojekt FSP 302 - Freie-Elektronen-Laser: Nanoskopische Systeme. Teilprojekt 1: Split-and-Delay Instrument für die European XFEL Beamline Materials Imaging and Dynamics
License: http://rightsstatements.org/vocab/InC/1.0/
Journal Title: AIP Conference Proceedings
Publisher: American Institute of Physics (AIP)
Publisher Place: Melville, NY
Volume: 1741
Issue: 1
Article Number: 030010
Publisher DOI: 10.1063/1.4952833
EISSN: 1551-7616
ISSN: 0094-243X
Notes: This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in AIP Conference Proceedings 1741, 030010 (2016) and may be found at https://doi.org/10.1063/1.4952833.
Appears in Collections:FG Röntgenoptik und Nanometer-Optik » Publications

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