Please use this identifier to cite or link to this item: http://dx.doi.org/10.14279/depositonce-10039
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Main Title: Generating circularly polarized radiation in the extreme ultraviolet spectral range at the free-electron laser FLASH
Author(s): Korff Schmising, Clemens von
Weder, David
Noll, Tino
Pfau, Bastian
Hennecke, Martin
Strüber, Christian
Radu, Ilie
Schneider, Michael
Staeck, Steffen
Günther, Christian M.
Lüning, Jan
Merhe, Alaa el Dine
Buck, Jens
Hartmann, Gregor
Viefhaus, Jens
Treusch, Rolf
Eisebitt, Stefan
Type: Article
Language Code: en
Abstract: A new device for polarization control at the free electron laser facility FLASH1 at DESY has been commissioned for user operation. The polarizer is based on phase retardation upon reflection off metallic mirrors. Its performance is characterized in three independent measurements and confirms the theoretical predictions of efficient and broadband generation of circularly polarized radiation in the extreme ultraviolet spectral range from 35 eV to 90 eV. The degree of circular polarization reaches up to 90% while maintaining high total transmission values exceeding 30%. The simple design of the device allows straightforward alignment for user operation and rapid switching between left and right circularly polarized radiation.
URI: https://depositonce.tu-berlin.de/handle/11303/11148
http://dx.doi.org/10.14279/depositonce-10039
Issue Date: 2017
Date Available: 19-May-2020
DDC Class: 530 Physik
Subject(s): XUV laser
polarization
free electron laser
spectroscopy
Sponsor/Funder: BMBF, 05K10KTB, Verbundprojekt: FSP 301 - FLASH: Nanoskopische Systeme. Teilprojekt 1.1: Universelle Experimentierkammer für Streuexperimente mit kohärenten Femtosekunden-Röntgenpulsen Multi Purpose Coherent Scattering Chamber for FLASH and XFEL 'MPscatt'
License: https://creativecommons.org/licenses/by/4.0/
Journal Title: Review of Scientific Instruments
Publisher: American Institute of Physics (AIP)
Publisher Place: Melville, NY
Volume: 88
Issue: 5
Article Number: 53903
Publisher DOI: 10.1063/1.4983056
EISSN: 1089-7623
ISSN: 0034-6748
Appears in Collections:FG Röntgenoptik und Nanometer-Optik » Publications

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