Please use this identifier to cite or link to this item: http://dx.doi.org/10.14279/depositonce-10073
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Main Title: In situ single-shot diffractive fluence mapping for X-ray free-electron laser pulses
Author(s): Schneider, Michael
Günther, Christian M.
Pfau, Bastian
Capotondi, Flavio
Manfredda, Michele
Zangrando, Marco
Mahne, Nicola
Raimondi, Lorenzo
Pedersoli, Emanuele
Naumenko, Denys
Eisebitt, Stefan
Type: Article
Language Code: en
Abstract: Free-electron lasers (FELs) in the extreme ultraviolet (XUV) and X-ray regime opened up the possibility for experiments at high power densities, in particular allowing for fluence-dependent absorption and scattering experiments to reveal non-linear light–matter interactions at ever shorter wavelengths. Findings of such non-linear effects are met with tremendous interest, but prove difficult to understand and model due to the inherent shot-to-shot fluctuations in photon intensity and the often structured, non-Gaussian spatial intensity profile of a focused FEL beam. Presently, the focused beam is characterized and optimized separately from the actual experiment. Here, we present the simultaneous measurement of XUV diffraction signals from solid samples in tandem with the corresponding single-shot spatial fluence distribution on the actual sample. Our in situ characterization scheme enables direct monitoring of the sample illumination, providing a basis to optimize and quantitatively understand FEL experiments. Free electron laser beam profile characterization is usually performed separately from the actual measurements and this leads to considerable uncertainty in the results. Here the authors demonstrate the simultaneous measurement of the FEL beam profile with the experiment by using integrated gratings.
URI: https://depositonce.tu-berlin.de/handle/11303/11182
http://dx.doi.org/10.14279/depositonce-10073
Issue Date: 2018
Date Available: 20-May-2020
DDC Class: 530 Physik
Subject(s): free-electron lasers
extreme ultraviolet
XUV
focused ion beam
X-ray
License: https://creativecommons.org/licenses/by/4.0/
Journal Title: Nature Communications
Publisher: Nature Publishing Group
Publisher Place: London
Volume: 9
Article Number: 214
Publisher DOI: 10.1038/s41467-017-02567-0
EISSN: 2041-1723
Appears in Collections:FG Röntgenoptik und Nanometer-Optik » Publications

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