Please use this identifier to cite or link to this item: http://dx.doi.org/10.14279/depositonce-10651
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Main Title: Radiometric characterization of a triggered narrow-bandwidth single-photon source and its use for the calibration of silicon single-photon avalanche detectors
Author(s): Georgieva, Hristina
López, Marco
Hofer, Helmuth
Christinck, Justus
Rodiek, Beatrice
Schnauber, Peter
Kaganskiy, Arsenty
Heindel, Tobias
Rodt, Sven
Reitzenstein, Stephan
Kück, Stefan
Type: Article
URI: https://depositonce.tu-berlin.de/handle/11303/11763
http://dx.doi.org/10.14279/depositonce-10651
License: https://creativecommons.org/licenses/by/4.0/
Abstract: The traceability of measurements of the parameters characterizing single-photon sources, such as photon flux and optical power, paves the way towards their reliable comparison and quantitative evaluation. In this paper, we present an absolute measurement of the optical power of a single-photon source based on an InGaAs quantum dot under pulsed excitation with a calibrated single-photon avalanche diode (SPAD) detector. For this purpose, a single excitonic line of the quantum dot emission with a bandwidth below 0.1 nm was spectrally filtered by using two tilted interference filters. Since high count rates are essential for many metrological applications, we optimized the setup efficiency by combining high overall transmission of the optical components with a geometrical enhancement of the extraction efficiency of a single quantum dot by a monolithic microlens to reach photon fluxes up to 3.7 * 10^5 photons per second at the SPADs. A relative calibration of two SPAD detectors with a relative standard uncertainty of 0.7% was carried out and verified by the standard calibration method using an attenuated laser. Finally, an Allan deviation analysis was performed giving an optimal averaging time of 92 s for the photon flux.
Subject(s): quantum radiometry
quantum metrology
single-photon source
single-photon detector
quantum dot
Issue Date: 7-Sep-2020
Date Available: 26-Oct-2020
Language Code: en
DDC Class: 600 Technik, Technologie
Sponsor/Funder: DFG, 232645976, GRK 1952: Metrologie komplexer Nanosysteme - NanoMet
DFG, 390837967, EXC 2123: QuantumFrontiers - Licht und Materie an der Quantengrenze
Journal Title: Metrologia
Publisher: Institute of Physics Publishing (IOP)
Volume: 57
Issue: 5
Article Number: 055001
Publisher DOI: 10.1088/1681-7575/ab9db6
EISSN: 1681-7575
ISSN: 0026-1394
TU Affiliation(s): Fak. 2 Mathematik und Naturwissenschaften » Inst. Festkörperphysik » AG Optoelektronik und Quantenbauelemente
Appears in Collections:Technische Universität Berlin » Publications

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