Transient laboratory X-ray absorption fine structure spectroscopy on thin films demonstrated with F8BT

Jonas, Adrian; Witte, Katharina; Kanngießer, Birgit; Stiel, Holger; Mantouvalou, Ioanna

FG Analytische Röntgenphysik

We present advanced instrumentation for the investigation of thin organic films offered by a laboratory X-ray absorption fine structure (XAFS) spectrometer for the soft X-ray range. The transmission spectrometer is based on a laser-produced plasma source in combination with a twin-arm reflection zone plate spectrometer. The efficiency and stability of the spectrometer allow for single shot measurements within 500 ps with a resolving power of E/ΔE ~ 900 in a range between 200 eV and 1300 eV. Through the implementation of an optical pump beam, also transient absorption measurements can be performed. The merits of the spectrometer are demonstrated through the investigation of poly[(9,9-dioctylfluorenyl- 2,7-diyl)-alt-co-(1,4-benzo-{2,1‘,3}-thiadiazole)] (F8BT), a polyfluorene copolymer. Transient optical pump soft X-ray probe spectroscopy with 500 ps time resolution detects changes in the C K edge spectrum which can be attributed to the lowest unoccupied molecular orbitals of the molecules in the benzothiadiazole unit.