Hole-based memory operation in an InAs/GaAs quantum dot heterostructure
dc.contributor.author | Marent, A. | |
dc.contributor.author | Nowozin, Tobias | |
dc.contributor.author | Gelze, J. | |
dc.contributor.author | Luckert, F. | |
dc.contributor.author | Bimberg, Dieter | |
dc.date.accessioned | 2022-01-19T20:36:09Z | |
dc.date.available | 2022-01-19T20:36:09Z | |
dc.date.issued | 2009-12-18 | |
dc.description | This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Appl. Phys. Lett. 95, 242114 (2009) and may be found at https://doi.org/10.1063/1.3275758. | en |
dc.description.abstract | We present an InAs/GaAs quantum dot (QD) memory structure with all-electrical data access which uses holes as charge carriers. Charging and discharging of the QDs are clearly controlled by a gate voltage. The stored information is read-out by a two-dimensional hole gas underneath the QD-layer. Time resolved drain-current-measurements demonstrate the memory operation. Present write times are 80 ns. | en |
dc.identifier.eissn | 1077-3118 | |
dc.identifier.issn | 0003-6951 | |
dc.identifier.uri | https://depositonce.tu-berlin.de/handle/11303/16170 | |
dc.identifier.uri | http://dx.doi.org/10.14279/depositonce-14944 | |
dc.language.iso | en | en |
dc.rights.uri | http://rightsstatements.org/vocab/InC/1.0/ | en |
dc.subject.ddc | 530 Physik | de |
dc.subject.other | magnetic hysteresis | en |
dc.subject.other | ohmic contacts | en |
dc.subject.other | quantum wells | en |
dc.subject.other | heterostructures | en |
dc.subject.other | electronic transport | en |
dc.subject.other | dynamic random-access-memory | en |
dc.subject.other | Hall effect | en |
dc.subject.other | field effect transistors | en |
dc.subject.other | quantum dots | en |
dc.title | Hole-based memory operation in an InAs/GaAs quantum dot heterostructure | en |
dc.type | Article | en |
dc.type.version | publishedVersion | en |
dcterms.bibliographicCitation.articlenumber | 242114 | en |
dcterms.bibliographicCitation.doi | 10.1063/1.3275758 | en |
dcterms.bibliographicCitation.issue | 24 | en |
dcterms.bibliographicCitation.journaltitle | Applied Physics Letters | en |
dcterms.bibliographicCitation.originalpublishername | American Institute of Physics (AIP) | en |
dcterms.bibliographicCitation.originalpublisherplace | Melville, NY | en |
dcterms.bibliographicCitation.volume | 95 | en |
tub.accessrights.dnb | domain | en |
tub.affiliation | Fak. 2 Mathematik und Naturwissenschaften::Inst. Festkörperphysik | de |
tub.affiliation.faculty | Fak. 2 Mathematik und Naturwissenschaften | de |
tub.affiliation.institute | Inst. Festkörperphysik | de |
tub.publisher.universityorinstitution | Technische Universität Berlin | en |
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