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Origin of defect luminescence in ultraviolet emitting AlGaN diode structures

Feneberg, Martin; Romero, Fátima; Goldhahn, Rüdiger; Wernicke, Tim; Reich, Christoph; Stellmach, Joachim; Mehnke, Frank; Knauer, Arne; Weyers, Markus; Kneissl, Michael

FG Experimentelle Nanophysik und Photonik

Light emitting diode structures emitting in the ultraviolet spectral range are investigated. The samples exhibit defect luminescence bands. Synchrotron-based photoluminescence excitation spectroscopy of the complicated multi-layer stacks is employed to assign the origin of the observed defect luminescence to certain layers. In the case of quantum well structures emitting at 320 and 290 nm, the n-type contact AlGaN:Si layer is found to be the origin of defect luminescence bands between 2.65 and 2.8 eV. For 230 nm emitters without such n-type contact layer, the origin of a defect double structure at 2.8 and 3.6 eV can be assigned to the quantum wells.