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Note: Reflection zone plates as highly resolving broadband optics for soft X-ray laboratory spectrometers

Jonas, Adrian; Meurer, Thomas; Kanngießer, Birgit; Mantouvalou, Ioanna

FG Analytische Röntgenphysik

The resolving power and relative efficiency of two off-axis reflection zone plates (RZPs) in the soft X-ray range between 1 nm and 5 nm were investigated. RZPs focus only a very narrow bandwidth around the design wavelength. By misaligning the RZP, the focused wavelength can be tuned through a much wider spectral range. Using a laser-produced plasma source, we demonstrate that a single RZP can be efficiently used for spectroscopy at arbitrary wavelengths in the investigated soft X-ray range.