Laboratory quick near edge x-ray absorption fine structure spectroscopy in the soft x-ray range with 100 Hz frame rate using CMOS technology

dc.contributor.authorJonas, Adrian
dc.contributor.authorStaeck, Steffen
dc.contributor.authorKanngießer, Birgit
dc.contributor.authorStiel, Holger
dc.contributor.authorMantouvalou, Ioanna
dc.date.accessioned2022-05-05T11:33:54Z
dc.date.available2022-05-05T11:33:54Z
dc.date.issued2021-02-16
dc.description.abstractIn laboratory based x-ray absorption fine structure (XAFS) spectroscopy, the slow readout speed of conventional CCD cameras can prolong the measuring times by multiple orders of magnitude. Using pulsed sources, e.g., laser-based x-ray sources, the pulse repetition rate often exceeds the frame rate of the CCD camera. We report the use of a scientific CMOS (sCMOS) camera for XAFS spectroscopy with a laser-produced plasma source facilitating measurements at 100 Hz. With this technological improvement, a new class of experiments becomes possible, starting from the time consuming analysis of samples with small absorption to pump-probe investigations. Furthermore, laboratory quick soft x-ray absorption fine structure (QXAFS) measurements with 10 ms time resolution are rendered feasible. We present the characterization of the sCMOS camera concerning noise characteristics and a comparison to conventional CCD camera performance. The feasibility of time resolved QXAFS measurements is shown by analyzing the statistical uncertainty of single shot spectra. Finally, XAFS spectroscopy on a complex sandwich structure with minute amounts of NiO exemplifies the additional merits of fast detectors.en
dc.description.sponsorshipDFG, 313838950, Neuartiges Laborspektrometer für Pump-Probe NEXAFS-Untersuchungen an Biomolekülen in wässriger Lösungen
dc.description.sponsorshipEC/H2020/654148/EU/The Integrated Initiative of European Laser Research Infrastructures/LASERLAB-EUROPEen
dc.identifier.eissn1089-7623
dc.identifier.issn0034-6748
dc.identifier.urihttps://depositonce.tu-berlin.de/handle/11303/16824
dc.identifier.urihttp://dx.doi.org/10.14279/depositonce-15602
dc.language.isoenen
dc.relation.ispartof10.14279/depositonce-14776
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subject.ddc530 Physikde
dc.subject.otherNEXAFSde
dc.subject.otherPump-Probede
dc.subject.otherLaserplasmaquellede
dc.subject.otherpump probeen
dc.subject.otherlaser produced plasma sourceen
dc.titleLaboratory quick near edge x-ray absorption fine structure spectroscopy in the soft x-ray range with 100 Hz frame rate using CMOS technologyen
dc.typeArticleen
dc.type.versionpublishedVersionen
dcterms.bibliographicCitation.articlenumber023102en
dcterms.bibliographicCitation.doi10.1063/5.0032628en
dcterms.bibliographicCitation.issue2en
dcterms.bibliographicCitation.journaltitleReview of Scientific Instrumentsen
dcterms.bibliographicCitation.originalpublishernameAIPen
dcterms.bibliographicCitation.originalpublisherplaceLondonen
dcterms.bibliographicCitation.volume92en
tub.accessrights.dnbfreeen
tub.affiliationFak. 2 Mathematik und Naturwissenschaften::Inst. Optik und Atomare Physik::FG Analytische Röntgenphysikde
tub.affiliation.facultyFak. 2 Mathematik und Naturwissenschaftende
tub.affiliation.groupFG Analytische Röntgenphysikde
tub.affiliation.instituteInst. Optik und Atomare Physikde
tub.publisher.universityorinstitutionTechnische Universität Berlinen

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