Megahertz-rate ultrafast X-ray scattering and holographic imaging at the European XFEL

dc.contributor.authorHagström, Nanna Zhou
dc.contributor.authorSchneider, Michael
dc.contributor.authorKerber, Nico
dc.contributor.authorYaroslavtsev, Alexander
dc.contributor.authorParra, Erick Burgos
dc.contributor.authorBeg, Marijan
dc.contributor.authorLang, Martin
dc.contributor.authorGünther, Christian M.
dc.contributor.authorSeng, Boris
dc.contributor.authorKammerbauer, Fabian
dc.contributor.authorPopescu, Horia
dc.contributor.authorPancaldi, Matteo
dc.contributor.authorNeeraj, Kumar
dc.contributor.authorPolley, Debanjan
dc.contributor.authorJangid, Rahul
dc.contributor.authorHrkac, Stjepan B.
dc.contributor.authorPatel, Sheena K. K.
dc.contributor.authorOvcharenko, Sergei
dc.contributor.authorTurenne, Diego
dc.contributor.authorKsenzov, Dmitriy
dc.contributor.authorBoeglin, Christine
dc.contributor.authorBaidakova, Marina
dc.contributor.authorKorff Schmising, Clemens von
dc.contributor.authorBorchert, Martin
dc.contributor.authorVodungbo, Boris
dc.contributor.authorChen, Kai
dc.contributor.authorLuo, Chen
dc.contributor.authorRadu, Florin
dc.contributor.authorMüller, Leonard
dc.contributor.authorMartínez Flórez, Miriam
dc.contributor.authorPhilippi-Kobs, André
dc.contributor.authorRiepp, Matthias
dc.contributor.authorRoseker, Wojciech
dc.contributor.authorGrübel, Gerhard
dc.contributor.authorCarley, Robert
dc.contributor.authorSchlappa, Justine
dc.contributor.authorKuiken, Benjamin E. Van
dc.contributor.authorGort, Rafael
dc.contributor.authorMercadier, Laurent
dc.contributor.authorAgarwal, Naman
dc.contributor.authorGuyader, Loic Le
dc.contributor.authorMercurio, Giuseppe
dc.contributor.authorTeichmann, Martin
dc.contributor.authorDelitz, Jan Torben
dc.contributor.authorReich, Alexander
dc.contributor.authorBroers, Carsten
dc.contributor.authorHickin, David
dc.contributor.authorDeiter, Carsten
dc.contributor.authorMoore, James
dc.contributor.authorRompotis, Dimitrios
dc.contributor.authorWang, Jinxiong
dc.contributor.authorKane, Daniel
dc.contributor.authorVenkatesan, Sandhya
dc.contributor.authorMeier, Joachim
dc.contributor.authorPallas, Florent
dc.contributor.authorJezynski, Tomasz
dc.contributor.authorLederer, Maximilian
dc.contributor.authorBoukhelef, Djelloul
dc.contributor.authorSzuba, Janusz
dc.contributor.authorWrona, Krzysztof
dc.contributor.authorHauf, Steffen
dc.contributor.authorZhu, Jun
dc.contributor.authorBergemann, Martin
dc.contributor.authorKamil, Ebad
dc.contributor.authorKluyver, Thomas
dc.contributor.authorRosca, Robert
dc.contributor.authorSpirzewski, Michał
dc.contributor.authorKuster, Markus
dc.contributor.authorTurcato, Monica
dc.contributor.authorLomidze, David
dc.contributor.authorSamartsev, Andrey
dc.contributor.authorEngelke, Jan
dc.contributor.authorPorro, Matteo
dc.contributor.authorMaffessanti, Stefano
dc.contributor.authorHansen, Karsten
dc.contributor.authorErdinger, Florian
dc.contributor.authorFischer, Peter
dc.contributor.authorFiorini, Carlo
dc.contributor.authorCastoldi, Andrea
dc.contributor.authorManghisoni, Massimo
dc.contributor.authorWunderer, Cornelia Beatrix
dc.contributor.authorFullerton, Eric E.
dc.contributor.authorShpyrko, Oleg G.
dc.contributor.authorGutt, Christian
dc.contributor.authorSanchez-Hanke, Cecilia
dc.contributor.authorDürr, Hermann A.
dc.contributor.authorIacocca, Ezio
dc.contributor.authorNembach, Hans T.
dc.contributor.authorKeller, Mark W.
dc.contributor.authorShaw, Justin M.
dc.contributor.authorSilva, Thomas J.
dc.contributor.authorKukreja, Roopali
dc.contributor.authorFangohr, Hans
dc.contributor.authorEisebitt, Stefan
dc.contributor.authorKläui, Mathias
dc.contributor.authorJaouen, Nicolas
dc.contributor.authorScherz, Andreas
dc.contributor.authorBonetti, Stefano
dc.contributor.authorJal, Emmanuelle
dc.date.accessioned2023-02-01T15:20:41Z
dc.date.available2023-02-01T15:20:41Z
dc.date.issued2022
dc.description.abstractThe advent of X-ray free-electron lasers (XFELs) has revolutionized fundamental science, from atomic to condensed matter physics, from chemistry to biology, giving researchers access to X-rays with unprecedented brightness, coherence and pulse duration. All XFEL facilities built until recently provided X-ray pulses at a relatively low repetition rate, with limited data statistics. Here, results from the first megahertz-repetition-rate X-ray scattering experiments at the Spectroscopy and Coherent Scattering (SCS) instrument of the European XFEL are presented. The experimental capabilities that the SCS instrument offers, resulting from the operation at megahertz repetition rates and the availability of the novel DSSC 2D imaging detector, are illustrated. Time-resolved magnetic X-ray scattering and holographic imaging experiments in solid state samples were chosen as representative, providing an ideal test-bed for operation at megahertz rates. Our results are relevant and applicable to any other non-destructive XFEL experiments in the soft X-ray range.en
dc.description.sponsorshipDFG, 170620586, SFB 925: Licht-induzierte Dynamik und Kontrolle korrelierter Quantensysteme
dc.description.sponsorshipDFG, 268565370, TRR 173: Spin+X: Der Spin in seiner kollektiven Umgebung
dc.identifier.eissn1600-5775
dc.identifier.issn0909-0495
dc.identifier.urihttps://depositonce.tu-berlin.de/handle/11303/18129
dc.identifier.urihttps://doi.org/10.14279/depositonce-16922
dc.language.isoen
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/
dc.subject.ddc540 Chemie und zugeordnete Wissenschaftende
dc.subject.otherXFELen
dc.subject.otherholographyen
dc.subject.othermagnetic X-ray scatteringen
dc.subject.othersoft X-raysen
dc.subject.otherultrafast X-ray imagingen
dc.titleMegahertz-rate ultrafast X-ray scattering and holographic imaging at the European XFELen
dc.typeArticle
dcterms.bibliographicCitation.doi10.1107/S1600577522008414
dcterms.bibliographicCitation.issue6
dcterms.bibliographicCitation.journaltitleJournal of Synchrotron Radiation
dcterms.bibliographicCitation.originalpublishernameInternational Union of Crystallography
dcterms.bibliographicCitation.originalpublisherplaceChester
dcterms.bibliographicCitation.pageend1464
dcterms.bibliographicCitation.pagestart1454
dcterms.bibliographicCitation.volume29
dcterms.rightsHolder.referenceCreative-Commons-Lizenz
tub.accessrights.dnbfree
tub.affiliationZentrale & sonstige Einrichtungen::Zentraleinrichtung Elektronenmikroskopie (ZELMI)
tub.publisher.universityorinstitutionTechnische Universität Berlin

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