Spectroscopic Analysis of Rare-Earth Silicide Structures on the Si(111) Surface

dc.contributor.authorSanna, Simone
dc.contributor.authorPlaickner, Julian
dc.contributor.authorHoltgrewe, Kris
dc.contributor.authorWettig, Vincent M.
dc.contributor.authorSpeiser, Eugen
dc.contributor.authorChandola, Sandhya
dc.contributor.authorEsser, Norbert
dc.date.accessioned2021-08-17T08:58:36Z
dc.date.available2021-08-17T08:58:36Z
dc.date.issued2021-07-23
dc.date.updated2021-08-01T15:55:59Z
dc.description.abstractTwo-dimensional rare-earth silicide layers deposited on silicon substrates have been intensively investigated in the last decade, as they can be exploited both as Ohmic contacts or as photodetectors, depending on the substrate doping. In this study, we characterize rare-earth silicide layers on the Si(111) surface by a spectroscopic analysis. In detail, we combine Raman and reflectance anisotropy spectroscopy (RAS) with first-principles calculations in the framework of the density functional theory. RAS suggests a weakly isotropic surface, and Raman spectroscopy reveals the presence of surface localized phonons. Atomistic calculations allow to assign the detected Raman peaks to phonon modes localized at the silicide layer. The good agreement between the calculations and the measurements provides a strong argument for the employed structural model.en
dc.description.sponsorshipDFG, 194370842, Surface optical spectroscopy of phonon and electron excitations in quasi one-dimensional metallic nanostructuresen
dc.description.sponsorshipDFG, 32870154, EXC 172: Centrum für Funktionelle Nanostrukturen (CFN)en
dc.identifier.eissn1996-1944
dc.identifier.urihttps://depositonce.tu-berlin.de/handle/11303/13508
dc.identifier.urihttp://dx.doi.org/10.14279/depositonce-12291
dc.language.isoenen
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/en
dc.subject.ddc530 Physikde
dc.subject.othersurface scienceen
dc.subject.otherSi(111)en
dc.subject.otherrare earth silicideen
dc.subject.otherterbium silicideen
dc.subject.otherRaman spectroscopyen
dc.subject.otherRASen
dc.subject.otherdensity functional theoryen
dc.subject.otherDFTen
dc.subject.otherthin filmsen
dc.subject.other2D materialsen
dc.titleSpectroscopic Analysis of Rare-Earth Silicide Structures on the Si(111) Surfaceen
dc.typeArticleen
dc.type.versionpublishedVersionen
dcterms.bibliographicCitation.articlenumber4104en
dcterms.bibliographicCitation.doi10.3390/ma14154104en
dcterms.bibliographicCitation.issue15en
dcterms.bibliographicCitation.journaltitleMaterialsen
dcterms.bibliographicCitation.originalpublishernameMDPIen
dcterms.bibliographicCitation.originalpublisherplaceBaselen
dcterms.bibliographicCitation.volume14en
tub.accessrights.dnbfreeen
tub.affiliationFak. 2 Mathematik und Naturwissenschaften::Inst. Festkörperphysikde
tub.affiliation.facultyFak. 2 Mathematik und Naturwissenschaftende
tub.affiliation.instituteInst. Festkörperphysikde
tub.publisher.universityorinstitutionTechnische Universität Berlinen

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