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Recombination dynamics of clusters in intense extreme-ultraviolet and near-infrared fields

Schütte, Bernd; Oelze, Tim; Krikunova, Maria; Arbeiter, Mathias; Fennel, Thomas; Vrakking, Marc J. J.; Rouzée, Arnaud

We investigate electron-ion recombination processes in clusters exposed to intense extreme-ultraviolet (XUV) or near-infrared (NIR) pulses. Using the technique of reionization of excited atoms from recombination (REAR), recently introduced in Schütte et al (2014 Phys. Rev. Lett. 112 253401), a large population of excited atoms, which are formed in the nanoplasma during cluster expansion, is identified under both ionization conditions. For intense XUV ionization of clusters, we find that the significance of recombination increases for increasing cluster sizes. In addition, larger fragments are strongly affected by recombination as well, as shown for the case of dimers. We demonstrate that for mixed Ar–Xe clusters exposed to intense NIR pulses, excited atoms and ions are preferentially formed in the Xe core. As a result of electron-ion recombination, higher charge states of Xe are efficiently suppressed, leading to an overall reduced expansion speed of the cluster core in comparison to the shell.
Published in: New Journal of Physics, 10.1088/1367-2630/17/3/033043, IOP