Enhanced photon-extraction efficiency from InGaAs/GaAs quantum dots in deterministic photonic structures at 1.3 μm fabricated by in-situ electron-beam lithography

dc.contributor.authorStrocka, N.
dc.contributor.authorMusiał, A.
dc.contributor.authorSchneider, P.-I.
dc.contributor.authorMrowiński, P.
dc.contributor.authorHolewa, P.
dc.contributor.authorBurger, S.
dc.contributor.authorQuandt, D.
dc.contributor.authorStrittmatter, André
dc.contributor.authorRodt, Sven
dc.contributor.authorReitzenstein, Stephan
dc.contributor.authorSęk, G.
dc.date.accessioned2020-02-17T12:01:47Z
dc.date.available2020-02-17T12:01:47Z
dc.date.issued2018-08-07
dc.descriptionThis article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in AIP Advances 8, 085205 (2018) and may be found at https://doi.org/10.1063/1.5038137.en
dc.description.abstractThe main challenge in the development of non-classical light sources remains their brightness that limits the data transmission and processing rates as well as the realization of practical devices operating in the telecommunication range. To overcome this issue, we propose to utilize universal and flexible in-situ electron-beam lithography and hereby, we demonstrate a successful technology transfer to telecom wavelengths. As an example, we fabricate and characterize especially designed photonic structures with strain-engineered single InGaAs/GaAs quantum dots that are deterministically integrated into disc-shaped mesas. Utilizing this approach, an extraction efficiency into free-space (within a numerical aperture of 0.4) of (10±2) % has been experimentally obtained in the 1.3 μm wavelength range in agreement with finite-element method calculations. High-purity single-photon emission with g(2)(0)<0.01 from such deterministic structure has been demonstrated under quasi-resonant excitation.en
dc.description.sponsorshipDFG, SFB 787, Halbleiter - Nanophotonik: Materialien, Modelle, Bauelementeen
dc.identifier.eissn2158-3226
dc.identifier.urihttps://depositonce.tu-berlin.de/handle/11303/10733
dc.identifier.urihttp://dx.doi.org/10.14279/depositonce-9630
dc.language.isoenen
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subject.ddc530 Physikde
dc.subject.otherelectron beam lithographyen
dc.subject.otherfinite element analysisen
dc.subject.othergallium arsenideen
dc.subject.otherIII-V semiconductorsen
dc.subject.otherindium compoundsen
dc.subject.otherintegrated opticsen
dc.subject.othernanofabricationen
dc.subject.othernanolithographyen
dc.subject.othernanophotonicsen
dc.subject.otheroptical fabricationen
dc.subject.otherphotoluminescenceen
dc.subject.othersemiconductor growthen
dc.subject.othersemiconductor quantum dotsen
dc.titleEnhanced photon-extraction efficiency from InGaAs/GaAs quantum dots in deterministic photonic structures at 1.3 μm fabricated by in-situ electron-beam lithographyen
dc.typeArticleen
dc.type.versionpublishedVersionen
dcterms.bibliographicCitation.articlenumber085205en
dcterms.bibliographicCitation.doi10.1063/1.5038137en
dcterms.bibliographicCitation.issue8en
dcterms.bibliographicCitation.journaltitleAIP Advancesen
dcterms.bibliographicCitation.originalpublishernameAmerican Institute of Physics (AIP)en
dcterms.bibliographicCitation.originalpublisherplaceNew Yorken
dcterms.bibliographicCitation.volume8en
tub.accessrights.dnbfreeen
tub.affiliationFak. 2 Mathematik und Naturwissenschaften::Inst. Festkörperphysik::AG Optoelektronik und Quantenbauelementede
tub.affiliation.facultyFak. 2 Mathematik und Naturwissenschaftende
tub.affiliation.groupAG Optoelektronik und Quantenbauelementede
tub.affiliation.instituteInst. Festkörperphysikde
tub.publisher.universityorinstitutionTechnische Universität Berlinen

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