Determination of the effective detector area of an energy-dispersive X-ray spectrometer at the scanning electron microscope using experimental and theoretical X-ray emission yields

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dc.contributor.authorProcop, Mathias
dc.contributor.authorHodoroaba, Vasile-Dan
dc.contributor.authorTerborg, Ralf
dc.contributor.authorBerger, Dirk
dc.date.accessioned2017-11-23T12:53:55Z
dc.date.available2017-11-23T12:53:55Z
dc.date.issued2016
dc.descriptionDieser Beitrag ist mit Zustimmung des Rechteinhabers aufgrund einer (DFG geförderten) Allianz- bzw. Nationallizenz frei zugänglich.de
dc.descriptionThis publication is with permission of the rights owner freely accessible due to an Alliance licence and a national licence (funded by the DFG, German Research Foundation) respectively.en
dc.description.abstractA method is proposed to determine the effective detector area for energy-dispersive X-ray spectrometers (EDS). Nowadays, detectors are available for a wide range of nominal areas ranging from 10 up to 150 mm2. However, it remains in most cases unknown whether this nominal area coincides with the “net active sensor area” that should be given according to the related standard ISO 15632, or with any other area of the detector device. Moreover, the specific geometry of EDS installation may further reduce a given detector area. The proposed method can be applied to most scanning electron microscope/EDS configurations. The basic idea consists in a comparison of the measured count rate with the count rate resulting from known X-ray yields of copper, titanium, or silicon. The method was successfully tested on three detectors with known effective area and applied further to seven spectrometers from different manufacturers. In most cases the method gave an effective area smaller than the area given in the detector description.en
dc.identifier.eissn1435-8115
dc.identifier.issn1431-9276
dc.identifier.urihttps://depositonce.tu-berlin.de/handle/11303/7176
dc.identifier.urihttp://dx.doi.org/10.14279/depositonce-6451
dc.language.isoen
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/
dc.subject.ddc570 Biowissenschaften; Biologie
dc.subject.otherenergy-dispersive X-ray spectrometeren
dc.subject.otherEDSen
dc.subject.otherEDXen
dc.subject.othereffective areaen
dc.subject.otherX-ray emission yielden
dc.subject.othergeometrical collection efficiencyen
dc.titleDetermination of the effective detector area of an energy-dispersive X-ray spectrometer at the scanning electron microscope using experimental and theoretical X-ray emission yieldsen
dc.typeArticle
dc.type.versionpublishedVersion
dcterms.bibliographicCitation.doi10.1017/s1431927616011788
dcterms.bibliographicCitation.issue6
dcterms.bibliographicCitation.journaltitleMicroscopy and microanalysis
dcterms.bibliographicCitation.originalpublishernameCambridge University Press
dcterms.bibliographicCitation.originalpublisherplaceNew York, NY
dcterms.bibliographicCitation.pageend1368
dcterms.bibliographicCitation.pagestart1360
dcterms.bibliographicCitation.volume22
tub.accessrights.dnbdomain
tub.affiliationZentrale & sonstige Einrichtungen::Zentraleinrichtung Elektronenmikroskopie (ZELMI)de
tub.affiliation.facultyZentrale & sonstige Einrichtungende
tub.affiliation.groupZentraleinrichtung Elektronenmikroskopie (ZELMI)de
tub.publisher.universityorinstitutionTechnische Universität Berlin

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