Combined 1D, 2D and 3D micro-XRF techniques for the analysis of illuminated manuscripts
| dc.contributor.author | Lachmann, Tim | |
| dc.contributor.author | Snickt, Geert van der | |
| dc.contributor.author | Haschke, Michael | |
| dc.contributor.author | Mantouvalou, Ioanna | |
| dc.date.accessioned | 2017-10-24T07:15:13Z | |
| dc.date.available | 2017-10-24T07:15:13Z | |
| dc.date.issued | 2016 | |
| dc.description | Dieser Beitrag ist mit Zustimmung des Rechteinhabers aufgrund einer (DFG geförderten) Allianz- bzw. Nationallizenz frei zugänglich. | de |
| dc.description | This publication is with permission of the rights owner freely accessible due to an Alliance licence and a national licence (funded by the DFG, German Research Foundation) respectively. | en |
| dc.description.abstract | The combination of several micro-XRF analysis modes is presented for the investigation of an illuminated parchment manuscript. With a commercial instrument, conventional micro-XRF spot analysis (0D) and mapping (2D) are performed, yielding detailed lateral elemental information. Depth resolution becomes accessible by mounting an additional polycapillary lens in front of an SDD detector. Quantitative confocal depth profiles (1D) are presented as well as the full separation of the front and the backside decorations with the help of fast 3D mappings of specific areas. Only through the use of these multidimensional modes can elemental information be assigned both to lateral and depth positions, making the analysis of such heterogeneous samples feasible. | en |
| dc.identifier.eissn | 1364-5544 | |
| dc.identifier.issn | 0267-9477 | |
| dc.identifier.uri | https://depositonce.tu-berlin.de/handle/11303/6894 | |
| dc.identifier.uri | http://dx.doi.org/10.14279/depositonce-6233 | |
| dc.language.iso | en | |
| dc.rights.uri | http://rightsstatements.org/vocab/InC/1.0/ | |
| dc.subject.ddc | 540 Chemie und zugeordnete Wissenschaften | de |
| dc.title | Combined 1D, 2D and 3D micro-XRF techniques for the analysis of illuminated manuscripts | en |
| dc.type | Article | en |
| dc.type.version | publishedVersion | en |
| dcterms.bibliographicCitation.doi | 10.1039/c6ja00220j | |
| dcterms.bibliographicCitation.issue | 10 | |
| dcterms.bibliographicCitation.journaltitle | Journal of analytical atomic spectrometry | en |
| dcterms.bibliographicCitation.originalpublishername | Royal Society of Chemistry | de |
| dcterms.bibliographicCitation.originalpublisherplace | Cambridge | de |
| dcterms.bibliographicCitation.pageend | 1997 | |
| dcterms.bibliographicCitation.pagestart | 1989 | |
| dcterms.bibliographicCitation.volume | 31 | |
| tub.accessrights.dnb | domain | |
| tub.affiliation | Fak. 2 Mathematik und Naturwissenschaften::Inst. Optik und Atomare Physik::FG Analytische Röntgenphysik | de |
| tub.affiliation.faculty | Fak. 2 Mathematik und Naturwissenschaften | de |
| tub.affiliation.group | FG Analytische Röntgenphysik | de |
| tub.affiliation.institute | Inst. Optik und Atomare Physik | de |
| tub.publisher.universityorinstitution | Technische Universität Berlin |
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