Polariton effects in the dielectric function of ZnO excitons obtained by ellipsometry

dc.contributor.authorCobet, Munise
dc.contributor.authorCobet, Christoph
dc.contributor.authorWagner, Markus R.
dc.contributor.authorEsser, Norbert
dc.contributor.authorThomsen, Christian
dc.contributor.authorHoffmann, Axel
dc.date.accessioned2020-03-10T11:18:28Z
dc.date.available2020-03-10T11:18:28Z
dc.date.issued2010-01-19
dc.descriptionThis article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Appl. Phys. Lett. 96, 031904 (2010) and may be found at https://doi.org/10.1063/1.3284656.en
dc.description.abstractThe complex dielectric tensor of ZnO in the regime of the excitonic transitions is determined with ellipsometry and analyzed concerning the quantization of the electromagnetic field in terms of coupled polariton-eigenmodes. Negative sections in the real part indicate the significant formation of polaritons for the dipole-allowed excitons of the three upper valence-bands Γ7,Γ9,Γ7. The transverse-longitudinal splittings which separate the upper polariton branch from the lower branch, corresponding to the k-vector of the used light, are deduced precisely for each subband. Mainly for E∥c, additional absorption peaks are observed at the longitudinal B-exciton and closely above. One is considered to be a mixed-mode and the other is seen as a consequence of interference effects in an exciton free surface layer which is also visible in reflectance anisotropy spectroscopy.en
dc.description.sponsorshipEC/FP7/218570/EU/MULTIFUNCTIONAL NANOMATERIALS CHARACTERISATION EXPLOITING ELLIPSOMETRY and POLARIMETRY/NANOCHARMen
dc.identifier.eissn1077-3118
dc.identifier.issn0003-6951
dc.identifier.urihttps://depositonce.tu-berlin.de/handle/11303/10903
dc.identifier.urihttp://dx.doi.org/10.14279/depositonce-9796
dc.language.isoenen
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subject.ddc530 Physikde
dc.subject.otherZnOen
dc.subject.otherpolariton effecten
dc.subject.otherdielectric functionen
dc.subject.otherreflectance anisotropy spectroscopyen
dc.titlePolariton effects in the dielectric function of ZnO excitons obtained by ellipsometryen
dc.typeArticleen
dc.type.versionpublishedVersionen
dcterms.bibliographicCitation.articlenumber031904en
dcterms.bibliographicCitation.doi10.1063/1.3284656en
dcterms.bibliographicCitation.issue3en
dcterms.bibliographicCitation.journaltitleApplied Physics Lettersen
dcterms.bibliographicCitation.originalpublishernameAmerican Institute of Physics (AIP)en
dcterms.bibliographicCitation.originalpublisherplaceMelville, NYen
dcterms.bibliographicCitation.volume96en
tub.accessrights.dnbfreeen
tub.affiliationFak. 2 Mathematik und Naturwissenschaften::Inst. Festkörperphysik::FG Optische Charakterisierung von Halbleiternde
tub.affiliation.facultyFak. 2 Mathematik und Naturwissenschaftende
tub.affiliation.groupFG Optische Charakterisierung von Halbleiternde
tub.affiliation.instituteInst. Festkörperphysikde
tub.publisher.universityorinstitutionTechnische Universität Berlinen

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