Transient laboratory X-ray absorption fine structure spectroscopy on thin films demonstrated with F8BT

dc.contributor.authorJonas, Adrian
dc.contributor.authorWitte, Katharina
dc.contributor.authorKanngießer, Birgit
dc.contributor.authorStiel, Holger
dc.contributor.authorMantouvalou, Ioanna
dc.date.accessioned2022-05-03T10:41:41Z
dc.date.available2022-05-03T10:41:41Z
dc.date.issued2021-07-08
dc.description.abstractWe present advanced instrumentation for the investigation of thin organic films offered by a laboratory X-ray absorption fine structure (XAFS) spectrometer for the soft X-ray range. The transmission spectrometer is based on a laser-produced plasma source in combination with a twin-arm reflection zone plate spectrometer. The efficiency and stability of the spectrometer allow for single shot measurements within 500 ps with a resolving power of E/ΔE ~ 900 in a range between 200 eV and 1300 eV. Through the implementation of an optical pump beam, also transient absorption measurements can be performed. The merits of the spectrometer are demonstrated through the investigation of poly[(9,9-dioctylfluorenyl- 2,7-diyl)-alt-co-(1,4-benzo-{2,1‘,3}-thiadiazole)] (F8BT), a polyfluorene copolymer. Transient optical pump soft X-ray probe spectroscopy with 500 ps time resolution detects changes in the C K edge spectrum which can be attributed to the lowest unoccupied molecular orbitals of the molecules in the benzothiadiazole unit.en
dc.identifier.urihttps://depositonce.tu-berlin.de/handle/11303/16795
dc.identifier.urihttp://dx.doi.org/10.14279/depositonce-15573
dc.language.isoenen
dc.relation.ispartof10.14279/depositonce-14776
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subject.ddc530 Physikde
dc.subject.otherlaboratory XAFSen
dc.subject.othersoft X-raysen
dc.subject.otherpump-probe spectroscopyen
dc.subject.othertransient NEXAFSen
dc.subject.otherF8BTen
dc.titleTransient laboratory X-ray absorption fine structure spectroscopy on thin films demonstrated with F8BTen
dc.typeConference Objecten
dc.type.versionpublishedVersionen
dcterms.bibliographicCitation.articlenumber1188611en
dcterms.bibliographicCitation.doi10.1117/12.2593245en
dcterms.bibliographicCitation.originalpublishernameSPIEen
dcterms.bibliographicCitation.originalpublisherplaceBellingham, WAen
dcterms.bibliographicCitation.proceedingstitleProceedings Volume 11886, International Conference on X-Ray Lasers 2020en
dcterms.bibliographicCitation.volume11886 (2020)en
tub.accessrights.dnbfreeen
tub.affiliationFak. 2 Mathematik und Naturwissenschaften::Inst. Optik und Atomare Physik::FG Analytische Röntgenphysikde
tub.affiliation.facultyFak. 2 Mathematik und Naturwissenschaftende
tub.affiliation.groupFG Analytische Röntgenphysikde
tub.affiliation.instituteInst. Optik und Atomare Physikde
tub.publisher.universityorinstitutionTechnische Universität Berlinen

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