Krachenfels, ThiloKiyan, TubaTajik, ShahinSeifert, Jean-Pierre2021-03-122021-03-122021-02-22https://depositonce.tu-berlin.de/handle/11303/12535http://dx.doi.org/10.14279/depositonce-11354This repository contains images of on-chip memories (in 16-bit TIFF and 8-bit PNG format) that were captured using the PHEMOS-1000 failure analysis microscope with the LLSI (Laser Logic State Imaging) and TLS (Thermal Laser Stimulation) techniques. The content of the imaged memories is provided in text and binary files. This data package is connected to the publication "Automatic Extraction of Secrets from the Transistor Jungle using Laser-Assisted Side-Channel Attacks" accepted for publication at USENIX Security 2021. Preprint: https://arxiv.org/abs/2102.11656en600 Technik, Medizin, angewandte Wissenschaftenhardware securityoptical probing attackside-channel analysisLLSITLSImage