Niermann, ToreLehmann, Michael2018-02-152018-02-152014https://depositonce.tu-berlin.de/handle/11303/7448http://dx.doi.org/10.14279/depositonce-6674This is a high resolution off-axis electron hologram series obtained with a transmission electron microscope of a Gallium Nitride (GaN) crystal in <11-20> zoneaxis orientation at atomic resolution. It contains the raw data of two holographic focal series obtained under equal conditions (no strong changes in illumination or microscope setup) a few minutes apart. The first series is a focal series of object holograms, where the GaN-crystal was located in one of the partial waves. The second series is taken with object removed from the field of view. The MTF of the camera is also supplied.en530 PhysikOff-axis Electron HolographyTransmission Electron HolographyFocal SeriesHigh Resolution Electron HolographyGallium NitrideGeneric Research Data24568718