Reduction of the transverse effective charge of optical phonons in ZnO under pressure
| dc.contributor.author | Reparaz, Juan Sebastián | |
| dc.contributor.author | Muniz, Luis Antonio | |
| dc.contributor.author | Wagner, Markus R. | |
| dc.contributor.author | Goñi, Alejandro R. | |
| dc.contributor.author | Alonso, Maria Isabel | |
| dc.contributor.author | Hoffmann, Axel | |
| dc.contributor.author | Meyer, Bruno K. | |
| dc.date.accessioned | 2020-03-10T12:15:57Z | |
| dc.date.available | 2020-03-10T12:15:57Z | |
| dc.date.issued | 2010-06-09 | |
| dc.description | This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Appl. Phys. Lett. 96, 231906 (2010) and may be found at https://doi.org/10.1063/1.3447798." | en |
| dc.description.abstract | From Raman scattering on a-plane wurtzite ZnO crystals we obtained a decreasing splitting between longitudinal and transversal optical phonons with A1 and E1 symmetry as a function of hydrostatic pressure up to 5.5 GPa. Consequently, the transverse effective charge (e∗T) exhibits a strong reduction with increasing pressure, yielding 2.17–14.6×10−3 P/GPa and 2.04–13.7×10−3 P/GPa (in units of the elementary charge) for the A1 and E1 phonons, respectively. We find a clear systematic in the linear pressure coefficient of e∗T with bond polarity for the series of wide-band gap semiconductors SiC, AlN, GaN, and ZnO. | en |
| dc.description.sponsorship | DFG, 43659573, SFB 787: Halbleiter - Nanophotonik: Materialien, Modelle, Bauelemente | en |
| dc.identifier.eissn | 1077-3118 | |
| dc.identifier.issn | 0003-6951 | |
| dc.identifier.uri | https://depositonce.tu-berlin.de/handle/11303/10906 | |
| dc.identifier.uri | http://dx.doi.org/10.14279/depositonce-9799 | |
| dc.language.iso | en | en |
| dc.rights.uri | http://rightsstatements.org/vocab/InC/1.0/ | en |
| dc.subject.ddc | 530 Physik | de |
| dc.subject.other | ZnO crystals | en |
| dc.subject.other | a-plane wurtzite ZnO | en |
| dc.subject.other | semiconductor | en |
| dc.subject.other | pressure dependence | en |
| dc.title | Reduction of the transverse effective charge of optical phonons in ZnO under pressure | en |
| dc.type | Article | en |
| dc.type.version | publishedVersion | en |
| dcterms.bibliographicCitation.articlenumber | 231906 | en |
| dcterms.bibliographicCitation.doi | 10.1063/1.3447798 | en |
| dcterms.bibliographicCitation.issue | 23 | en |
| dcterms.bibliographicCitation.journaltitle | Applied Physics Letters | en |
| dcterms.bibliographicCitation.originalpublishername | American Institute of Physics (AIP) | en |
| dcterms.bibliographicCitation.originalpublisherplace | Melville, NY | en |
| dcterms.bibliographicCitation.volume | 96 | en |
| tub.accessrights.dnb | free | en |
| tub.affiliation | Fak. 2 Mathematik und Naturwissenschaften::Inst. Festkörperphysik::FG Optische Charakterisierung von Halbleitern | de |
| tub.affiliation.faculty | Fak. 2 Mathematik und Naturwissenschaften | de |
| tub.affiliation.group | FG Optische Charakterisierung von Halbleitern | de |
| tub.affiliation.institute | Inst. Festkörperphysik | de |
| tub.publisher.universityorinstitution | Technische Universität Berlin | en |