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Exploiting the features of energy-dispersive synchrotron diffraction for advanced residual stress and texture analysis

Genzel, Ch.; Denks, I. A.; Coelho, R.; Thomas, D.; Mainz, R.; Apel, D.; Klaus, M.

Responding to a growing interest from the materials science community for residual stress, texture, and microstructure analysis, strong efforts are made to enhance existing and develop novel methods that allow for fast in-situ studies at elevated temperature, measurements under external load, or residual strain, and stress scanning with high spatial resolution. In the paper, energy-dispersive diffraction using high-energy white synchrotron radiation is shown to provide some distinct advantages concerning residual stress and texture analysis, which mainly arise from the fact that the energy-dispersive diffraction mode allows for the measurement of complete diffraction patterns under fixed but arbitrary scattering angles, 2θ. A new two-detector set-up for simultaneous in- and out-of-plane diffraction analysis, which has been put into operation recently at the energy-dispersive materials science beamline EDDI at BESSY II, is introduced by using the examples of real-space residual stress and texture depth profiling on mechanically treated polycrystalline materials as well as of the in-situ study of (residual) stress evolution in a thin film at elevated temperature. It will be demonstrated that the individual measuring problems require the application of different geometrical slit configurations to define the pathways of the diffracted beams.
Published in: The Journal of Strain Analysis for Engineering Design, 10.1177/0309324711403824, SAGE Publications
  • Dieser Beitrag ist mit Zustimmung des Rechteinhabers aufgrund einer (DFG geförderten) Allianz- bzw. Nationallizenz frei zugänglich.
  • This publication is with permission of the rights owner freely accessible due to an Alliance licence and a national licence (funded by the DFG, German Research Foundation) respectively.