Exploiting the features of energy-dispersive synchrotron diffraction for advanced residual stress and texture analysis
dc.contributor.author | Genzel, Ch. | |
dc.contributor.author | Denks, I. A. | |
dc.contributor.author | Coelho, R. | |
dc.contributor.author | Thomas, D. | |
dc.contributor.author | Mainz, R. | |
dc.contributor.author | Apel, D. | |
dc.contributor.author | Klaus, M. | |
dc.date.accessioned | 2019-01-08T17:34:37Z | |
dc.date.available | 2019-01-08T17:34:37Z | |
dc.date.issued | 2011 | |
dc.description | Dieser Beitrag ist mit Zustimmung des Rechteinhabers aufgrund einer (DFG geförderten) Allianz- bzw. Nationallizenz frei zugänglich. | de |
dc.description | This publication is with permission of the rights owner freely accessible due to an Alliance licence and a national licence (funded by the DFG, German Research Foundation) respectively. | en |
dc.description.abstract | Responding to a growing interest from the materials science community for residual stress, texture, and microstructure analysis, strong efforts are made to enhance existing and develop novel methods that allow for fast in-situ studies at elevated temperature, measurements under external load, or residual strain, and stress scanning with high spatial resolution. In the paper, energy-dispersive diffraction using high-energy white synchrotron radiation is shown to provide some distinct advantages concerning residual stress and texture analysis, which mainly arise from the fact that the energy-dispersive diffraction mode allows for the measurement of complete diffraction patterns under fixed but arbitrary scattering angles, 2θ. A new two-detector set-up for simultaneous in- and out-of-plane diffraction analysis, which has been put into operation recently at the energy-dispersive materials science beamline EDDI at BESSY II, is introduced by using the examples of real-space residual stress and texture depth profiling on mechanically treated polycrystalline materials as well as of the in-situ study of (residual) stress evolution in a thin film at elevated temperature. It will be demonstrated that the individual measuring problems require the application of different geometrical slit configurations to define the pathways of the diffracted beams. | en |
dc.identifier.eissn | 2041-3130 | |
dc.identifier.issn | 0309-3247 | |
dc.identifier.uri | https://depositonce.tu-berlin.de/handle/11303/8858 | |
dc.identifier.uri | http://dx.doi.org/10.14279/depositonce-7987 | |
dc.language.iso | en | |
dc.rights.uri | http://rightsstatements.org/vocab/InC/1.0/ | |
dc.subject.ddc | 620 Ingenieurwissenschaften und zugeordnete Tätigkeiten | de |
dc.subject.other | energy-dispersive diffraction | en |
dc.subject.other | residual stress | en |
dc.subject.other | texture | en |
dc.subject.other | depth profiling | en |
dc.subject.other | in-situ thin-film characterization | en |
dc.title | Exploiting the features of energy-dispersive synchrotron diffraction for advanced residual stress and texture analysis | en |
dc.type | Article | en |
dc.type.version | publishedVersion | en |
dcterms.bibliographicCitation.doi | 10.1177/0309324711403824 | |
dcterms.bibliographicCitation.issue | 7 | |
dcterms.bibliographicCitation.journaltitle | The Journal of Strain Analysis for Engineering Design | en |
dcterms.bibliographicCitation.originalpublishername | SAGE Publications | en |
dcterms.bibliographicCitation.originalpublisherplace | Washington, DC | en |
dcterms.bibliographicCitation.pageend | 625 | |
dcterms.bibliographicCitation.pagestart | 615 | |
dcterms.bibliographicCitation.volume | 46 | |
tub.accessrights.dnb | domain | |
tub.affiliation | Fak. 3 Prozesswissenschaften::Inst. Werkstoffwissenschaften und -technologien::FG Metallische Werkstoffe | de |
tub.affiliation.faculty | Fak. 3 Prozesswissenschaften | de |
tub.affiliation.group | FG Metallische Werkstoffe | de |
tub.affiliation.institute | Inst. Werkstoffwissenschaften und -technologien | de |
tub.publisher.universityorinstitution | Technische Universität Berlin | de |
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